NIKON CM-20L

Semiconductor Component Information

Technical Details

Confidence: 95%

Description

Metrology equipment for wafer inspection

Application

Wafer inspection and measurement

Equipment Category

Metrology

Data Sources

3 sources

Last Updated

July 24, 2025 at 6:06 AM CST

Active Listings

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Count: 2

Average Price: $1,066.00

Sold Items

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Count: 3

Average Price: $595.30

Sold Percentage

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Unsold Items: 0

Success Rate: 100.0%

Active Listings

Sold Listings

Unsold Listings

No Unsold Listings

Item Views

This item has been viewed 34 times
Japan Friday, Oct/03/2025 at 3:49 am CST
United States of America Tuesday, Sep/30/2025 at 9:09 pm CST
United States of America Saturday, Sep/27/2025 at 9:15 am CST
China Thursday, Sep/25/2025 at 1:36 am CST
China Wednesday, Sep/24/2025 at 3:19 am CST
China Wednesday, Sep/24/2025 at 3:00 am CST
United States of America Saturday, Sep/20/2025 at 11:51 pm CST
United States of America Friday, Sep/19/2025 at 5:34 pm CST
United States of America Tuesday, Sep/16/2025 at 12:37 pm CST
United States of America Monday, Sep/15/2025 at 3:47 am CST

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